MITSemiconductor equipment

Fully Automated Wafer Scanning Acoustic Tester-W (Wafer)

Name: Fully Automated Wafer Scanning Acoustic Tester-W (Wafer)
Brand: MIT

Model: 請留言洽詢

Product Information

Product NameFully Automated Wafer Scanning Acoustic Tester-W (Wafer)

BrandMIT

Product Model請留言洽詢

Sales Contactsw@sellingware.com.tw

▪ Fully Automated Wafer Scanning Acoustic Tomography (SAT)

▪ Multi-probe head

▪ Transducer frequency: 50~250MHz

▪ Scanning Area: 300×300mm

▪ Dimensions: 1750×2200×2000mm