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MITSemiconductor equipment

Fully Automated Wafer Scanning Acoustic Tester - PAC (Advanced Package)

Model: 請留言洽詢

Fully Automated Wafer Scanning Acoustic Tester - PAC (High-end Model)

Product Information

Product NameFully Automated Wafer Scanning Acoustic Tester - PAC (Advanced Package)
BrandMIT
Product Model請留言洽詢
Sales Contactsw@sellingware.com.tw
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Specifications

▪ Fully Automatic SAT Suite

▪ Multi-probe

▪ Sensor Frequency: 25-200MHz

▪ Scanning Area: 300x200 (mm)

▪ Dimensions: 3200X2000X2150(mm)

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